Choi, S.-H.; Lee, D.-H.; Kim, E.-S.; Bae, Y.-M.; Oh, Y.-C.; Kim, K.-J., "Development of a spatial dimension-based taxonomy for classifying the defect patterns in a wafer bin map" ,Advanced Engineering Informatics, vol.60, - (2024).
Ryu, D.-H.; Kim, K.-J., "The influence of information privacy concerns and perceived electricity usage habits on the usage intention of advanced metering infrastructure" ,Renewable and Sustainable Energy Reviews, vol.189, - (2024).
Bae, YM; Kim, YG; Seo, JW; Kim, HA; Shin, CH; Son, JH; Lee, GH; KIM, KJ, "Detecting abnormal behavior of automatic test equipment using autoencoder with event log data" ,Computers and Industrial Engineering, vol.183, -(2023).
Lee, DH; Kim, ES; Choi, SH; Bae, YM; Park, JB; Oh, YC; Kim, KJ, "Development of taxonomy for classifying defect patterns on wafer bin map using Bin2Vec and clustering methods" ,Computers in Industry, vol.152, - (2023).
Rakhmawati, DY; Kim, KJ; Sumiati, "Performance comparison of generalized confidence interval and modified sampling distribution approaches for assessing one-sided capability indices with gauge measurement errors" ,COMMUNICATIONS IN STATISTICS-THEORY AND M